Octavian Buiu

Sales Manager


+40 755 039900
Fax: +40 317107156


Motorized Czerny-Turner spectrographs
UV-CureRight Radiometer
Voltage controlled current source
AFSEM - correlative AFM and SEM
Cryostats with closed helium cycles
Dichroic filters and sets
Chemical and nanoscale imaging system
Basic Raman system
Superior confocal Raman imaging system
Combined Raman and scanning nearfield optical microscopy (SNOM) system
Raman, AFM and SNOM all-in-one system
Large area profilometry for topographic Raman imaging
Automated 3D Raman imaging system
NIR spectroscopy with photo diode array
Low-noise CCD detectors
High-throughput transmission grating spectrograph
Silicon infrared polarizers 3000 - 15000 nm
Thermographic NDE
UV polarizers 240 - 400 nm
Visible light polarizers 420 - 700 nm
Infrared polarizers 700 - 2500 nm
Inorganic absorptive polarizers
Pixelated polarizers
Ultra broadband polarizers
Spectroradiometer 200 - 450 nm and 250 - 1050 nm
Advanced technology helium liquefier
Ellipsometer for texture Si solar cells T-Solar
Optics and optical coatings
Optical tables and breadboards
Ferromagnetic resonance spectroscopy (FMR)
Carbon nanotube characterization
Cryogenic Probe Station
AC Susceptometer
Manual stages and holders
High-speed streaming cameras
Vacuum spectrographs for VUV and XUV / EUV spectroscopy
CCD cameras with shutter
Vacuum nanoindenter
Particle size analyzer
FLX Flexus thin film stress measurement systems
Raman spectroscopy filters
Hartmann-Shack wavefront sensor
Nanoindenter NanoTest CORE Range
Short introduction: nanoindentation
Photo lithography systems
The FP Profiler for large samples
EMCCD cameras
Cryogenic temperature monitors
Arc light sources
Deuterium light sources
Fiber optic light sources
Light sources for calibration
Optical filters for light sources
Light source accessories
Tunable monochromatic light sources
Cryogenic accessories
Cryogenic temperature sensors
Research picoammeter with Wifi
Cameras and detectors for time-resolved imaging and spectroscopy
Fast spectroscopic ellipsometer M-2000
Dual rotating compensator ellipsometer RC2
Economic high precision table top ellipsometer Alpha-SE
Widest spectral range ellipsometer VASE
Spectroscopic ellipsometer for Vacuum Ultra Violet: VUV-VASE
CCD cameras for direct detection (<20 keV)
Cryogenic temperature controllers
Astronomy/UVBRI filters
Standard infrared bandpass filters
Edge filters
Calibration filter sets
Standard bandpass filters and sets
IR sources
Laser line filters
Modified magnetron ET filter sets
Datalogging optometer
Research radiometer with Wifi
Colored glass filters
In-situ spectroscopic ellipsometer iSE
Bi-concave lenses
Monochromator order sorting filters
Heat control filters
Helium recovery and liquefaction plants
FTIR ellipsometer IR-VASE
MSH-300 with variable slits & MSH-300F with fixed slits
Plano concave lenses
Plano convex lenses
Neutral density filter sets
Halogen light sources
Dielectric notch filters
Hand-held light meter & optometer
MSH-150 with variable slits & MSH-150F with fixed slits
Bi-convex lenses
Magnetic field platform
MSHD-300 with variable slits & MSHD-300F with fixed slits
MPMS3 SQUID magnetometer
Correlative Raman imaging and scanning electron microscopy (Raman-SEM)
High-performance CCD detectors
Basic Confocal Raman Microscope
High-end thermography cameras
Echelle spectrograph
EMCCD detectors for spectroscopy
Manual single grating spectrograph
Thermal image plates
Closed-cycle optical cryostat
Nanoscale surface characterization system
SNOM, confocal microscopy and AFM system
NIR compact camera
SWIR spectral camera
MWIR spectral camera
LWIR spectral camera
Multipoint spectrometers
Hyperspectral single core scanner
VIS/NIR spectral cameras
VIS/NIR compact camera
VIS/NIR all-in-one compact camera
Portable, cryogen-free material characterization platform
CO, HF and DF laser spectrum analyzer
CO2 laser spectrum analyzer
Closed-cycle optical cryostat with intermediate sample chamber and integrated cold sample electronics size
Physical Property Measurements in a cryogen-free system (PPMS DynaCool)
Physical Property Measurement System (PPMS)
Kerr magnetometer
Advanced technology helium gas purifier
Beam probes
Ultra stable closed-cycle optical cryostat
Closed-cycle optical cryostat with breadboard
Vibrating Sample Magnetometer (VSM) with electromagnet
2 and 4 mirror infrared single crystal furnace
Small NIR camera with short integration time
Cameras for indirect detection (>20 keV)
Uncooled thermal camera
Fast large format camera covering visible to near infrared
High performance NIR camera
Fast large formate near infrared camera
Compact near infrared camera
Flexible small near infrared camera
Cooled mid infrared camera
Small camera covering visible to near infrared
Cooled camera covering visible to near infrared
Small uncooled camera covering visible to near infrared
Standard near infrared camera
Compact SWIR camera
Imaging spectrograph NIR and SWIR
Imaging spectrograph MWIR
Stand-alone X-ray cameras
High-speed cameras with internal memory
Optical tweezers
Imaging spectrographs VIS and VisNIR
Compact airborne VNIR and eNIR hyperspectral system
Airborne continuous VNIR and SWIR hyperspectral system
Airborne thermal hyperspectral system
Hyperspectral drill core imaging station
Hyperspectral chemical imaging analyzer
Complete thermographic inspection solution
Airborne fluorescence hyperspectral imaging system
Thermographic turbine test station
Advanced thermography for in-service inspection


Seeking a distributor?

If you are looking to partner with an experienced sales and service company to distribute your systems or components please contact Jürgen Schlütter.


Jürgen Schlütter
Managing Director
+49 6151 8806-496
Fax: +49 6151 88069496
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© LOT Quantum Design 2016