The Zygo portable profiler – Key features

  • Measures both smooth and rough optics
  • Can measure step heights and diffractive surfaces up to 80μm
  • Uses ZYGO proprietary SureScan acquisition technology to enable low uncertainty metrology in the presence of vibration
  • The asymmetric design enables metrology near the outside edge of a large optic
  • Integrated focus aid simplifies alignment
  • Can use large range of standard ZYGO microscope objectives From 2.75x to 100x
  • Operates on Zygo’s new Mx metrology software

The ZYGO portable profiler offers a more complete solution for the measurement of large optics.

Contact

Quantum Design

Str Ion Nistor 4, et 1, M2E
030041 Bucharest
Romania

Phone:+40 755039900
Fax:+40 317107156
E-mail:romaniaqd-europe.com