Nanoscale surface characterization system

Alpha300 A from WITec

The WITec atomic force microscope (AFM) alpha300 A is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope which provides superior optical access, easy cantilever alignment and high-resolution sample survey.

Surface characterization on the nanometer scale
Nondestructive analysis
Minimal, if any, sample preparation
Ease of use in air and liquids
Precise TrueScan controlled scan stage with a range of 100 µm x 100 µm x 20 µm

WITec atomic force microscopes (AFMs) are developed and designed to allow combination with other imaging techniques such as confocal Raman imaging. All imaging techniques can be integrated within the same microscope system. By simply rotating the microscope turret the user can then switch between the different methods. Possible combinations with AFM include luminescence, fluorescence, polarization analysis, bright field, dark field, SNOM, and Raman imaging.

The alpha300A offers the following extensions:

  • Automated multi-area measurements (incl. auto approach)
  • Automated motorized sample positioner in x-, y-, and z-direction, 25 mm travel range
  • alpha300 A+ for automated measurements
  • alpha500 A for automated large sample investigations
  • Motorized scan stage for large-area measurements (150 x 100 mm) with automated sample positioner in x-, y-, and z-direction
  • Motorized z-stage system for automated approach
  • Automated multi-area and multi-point measurements
  • Autofocus

Operation Modes:

  • Contact Mode
  • AC Mode (Tapping Mode)
  • Digital Pulsed Force Mode (DPFM)
  • Lift Mode
  • Magnetic Force Microscopy (MFM)
  • Electric Force Microscopy (EFM)
  • Phase Imaging
  • Force Distance Curves
  • Nano-Manipulation/Lithography
  • Lateral Force Microscopy (LFM)
  • Chemical Force Microscopy (CFM)
  • Current Sensing Mode
  • Microscope Features:
  • Research grade optical microscope with 6 x objective turret
  • Video system: eyepiece color video camera
  • LED white-light source for Köhler illumination of tip and sample
  • High sensitivity b/w video camera to view sample and AFM tip in transmission
  • Manual sample positioning in x- and y-direction, 25 mm travel
  • Microscope base with active vibration isolation system
  • Piezo-driven scan stage (scan range 100 x 100 x 20 µm; others optional)

AFM Cantilever:

  • Inertial drive cantilever mechanics for AFM sensors
  • Most commercially available AFM cantilever can be used


  • AFM sensors, Acoustic AC mode type, with reflex coating, pre-mounted on magnetic rings
  • AFM sensors, contact mode type, with reflex coating, pre-mounted on magnetic rings
  • Most commercially available sensors can be used

Sample Size:

  • Usually 120 mm in x- and y-direction, 25 mm in height (adapter for larger heights available)

Computer Interface:

  • WITec software for instrument and measurement control, data evaluation and processing
Life science

From measurements in liquids to solid samples or soft tissues in life science varied samples are analyzed on a regular basis. With their convenient handling and versatile analytical capabilities the flexible WITec imaging systems provide the opportunity to adjust the imaging technique to changing requirements and are particularly well-suited for life science.

Pharmaceutics, cosmetics

The development and production of drug delivery systems requires efficient and reliable control mechanisms to ensure the quality of the final products. These products can vary widely in composition and application. Therefore analytical tools such as the WITec imaging systems that provide both comprehensive chemical characterization and the flexibility to adjust the method to the investigated specimen are preferred in pharmaceutical research.

Materials science

Materials science is a diverse field including the development and testing of new substances, as well as the refinement of manufacturing processes and quality control for existing products. WITec imaging systems are particularly well-suited for comprehensive sample analyses in materials science and provide the opportunity to acquire a thorough knowledge of the sample surface morphology and chemical composition.


WITec confocal Raman imaging systems are excellent analytical tools for the comprehensive investigation of geological samples, such as the identification and characterization of minerals, or in the observation of mineral phase transitions in high and ultra-high pressure/temperature experiments.


WITec imaging systems enable comprehensive sample analysis that provides a thorough characterization of the physical and chemical properties of the polymers on the nanometer scale.

Nano-Carbon and graphene

Nano-carbon materials such as graphene or carbon nano-tubes show immense promise in many applications such as transistors, sensors, and optoelectronics. Flexible and adaptive analytical methods can support effective investigation and accelerate progress in nano-carbon & graphene research and development.


Request further information
Sales Manager
+40 755 039900
Fax: +40 317107156

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