Octavian Buiu

Sales Manager


+40 755 039900
Fax: +40 317107156


High-throughput bright field and fluorescence scanner
Optical coherence tomography system
High-speed streaming cameras
EMCCD cameras
Vacuum nanoindenter
Motorized Czerny-Turner spectrographs
CCD cameras with shutter
Hartmann-Shack wavefront sensor
UV-CureRight Radiometer
High-throughput bright-field scanner
Filtre dichroice
Dual rotating compensator ellipsometer RC2
Spectroscopic ellipsometer for Vacuum Ultra Violet: VUV-VASE
Research picoammeter with Wifi
Arc light sources
Deuterium light sources
Fiber optic light sources
Raman spectroscopy filters
Light sources for calibration
Optical filters for light sources
Light source accessories
Tunable monochromatic light sources
Edge filters
Laser line filters
Modified magnetron ET filter sets
Calibration filter sets
Standard bandpass filters and sets
Research radiometer with Wifi
Colored glass filters
Cameras and detectors for time-resolved imaging and spectroscopy
IR sources
Filtre pentru astronomie (UVBRI)
Datalogging optometer
Spectroradiometer 200 - 450 nm and 250 - 1050 nm
Standard infrared bandpass filters
Elipsometru compact, de mare precizie – ALPHA-SE
Widest spectral range ellipsometer VASE
Bi-concave lenses
Monochromator order sorting filters
Filtre pentru control caldura
Dielectric notch filters
Fast spectroscopic ellipsometer M-2000
MSH-300 with variable slits & MSH-300F with fixed slits
Hand-held light meter & optometer
FTIR ellipsometer IR-VASE
Ellipsometer for texture Si solar cells T-Solar
Plano concave lenses
Halogen light sources
Lentile plan-covexe
Neutral density filter sets
MSH-150 with variable slits & MSH-150F with fixed slits
Bi-convex lenses
Magnetic field platform
MSHD-300 with variable slits & MSHD-300F with fixed slits
Correlative Raman imaging and scanning electron microscopy (Raman-SEM)
High-performance CCD detectors
Basic Confocal Raman Microscope
High-end thermography cameras
NIR spectroscopy with photo diode array
Low-noise CCD detectors
Vacuum spectrographs for VUV and XUV / EUV spectroscopy
AFSEM - correlative AFM and SEM
Photo lithography systems
Echelle spectrograph
High-throughput transmission grating spectrograph
EMCCD detectors for spectroscopy
sCMOS cameras
Manual single grating spectrograph
FLX Flexus thin film stress measurement systems
CCD cameras for direct detection (<20 keV)
Thermal image plates
UV polarizers 240 - 400 nm
Closed-cycle optical cryostat
Nanoscale surface characterization system
Chemical and nanoscale imaging system
SNOM, confocal microscopy and AFM system
Basic Raman system
Superior confocal Raman imaging system
Combined Raman and scanning nearfield optical microscopy (SNOM) system
Raman, AFM and SNOM all-in-one system
Large area profilometry for topographic Raman imaging
Automated 3D Raman imaging system
NIR compact camera
SWIR spectral camera
MWIR spectral camera
LWIR spectral camera
Multipoint spectrometers
Hyperspectral single core scanner
VIS/NIR spectral cameras
VIS/NIR compact camera
VIS/NIR all-in-one compact camera
Ferromagnetic resonance spectroscopy (FMR)
Cryogenic temperature monitors
Cryogenic accessories
Cryogenic temperature sensors
Portable, cryogen-free material characterization platform
CO, HF and DF laser spectrum analyzer
CO2 laser spectrum analyzer
Closed-cycle optical cryostat with intermediate sample chamber and integrated cold sample electronics size
Physical Property Measurements in a cryogen-free system (PPMS DynaCool)
Physical Property Measurement System (PPMS)
Kerr magnetometer
Advanced technology helium gas purifier
Advanced technology helium liquefier
Beam probes
AC Susceptometer
Helium recovery and liquefaction plants
Ultra stable closed-cycle optical cryostat
Closed-cycle optical cryostat with breadboard
Vibrating Sample Magnetometer (VSM) with electromagnet
MPMS3 SQUID magnetometer
Nanoindenter NanoTest CORE Range
Cryogenic temperature controllers
Benchtop NMR MQC analyzer
The FP Profiler for large samples
Short introduction: nanoindentation
2 and 4 mirror infrared single crystal furnace
Small NIR camera with short integration time
Particle size analyzer
Cameras for indirect detection (>20 keV)
Uncooled thermal camera
Fast large format camera covering visible to near infrared
Small, uncooled near infrared camera
High performance NIR camera
Fast large formate near infrared camera
Compact near infrared camera
Flexible small near infrared camera
Cooled mid infrared camera
Small camera covering visible to near infrared
Cooled camera covering visible to near infrared
Small uncooled camera covering visible to near infrared
Standard near infrared camera
Compact SWIR camera
IV measurement station
Imaging spectrograph NIR and SWIR
Cryogenic Probe Station
Imaging spectrograph MWIR
Stand-alone X-ray cameras
High-speed cameras with internal memory
Optical tweezers
Imaging spectrographs VIS and VisNIR
Compact airborne VNIR and eNIR hyperspectral system
Airborne continuous VNIR and SWIR hyperspectral system
Airborne thermal hyperspectral system
Hyperspectral drill core imaging station
Hyperspectral chemical imaging analyzer
Complete thermographic inspection solution
Airborne fluorescence hyperspectral imaging system
Thermographic turbine test station
Thermographic NDE
Adiabatic Demagnetisation Refrigerators (ADR) and Dilution Refrigerators (DR)
Advanced thermography for in-service inspection
Inorganic absorptive polarizers
Pixelated polarizers
Ultra broadband polarizers
Silicon infrared polarizers 3000 - 15000 nm
Infrared polarizers 700 - 2500 nm
Carbon nanotube characterization
Visible light polarizers 420 - 700 nm



Jürgen Schlütter
Managing Director
+49 6151 8806-496
Fax: +49 6151 88069496
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European offices
© LOT Quantum Design 2016